E. Gurjão, K. Dias, and M. Amaris.
" Tolerância a falhas em multi-controladores SDN: eficiência de controladores RYU usando Mininet", in <em>Proceedings of the 1st Regional School of High Performance North 2 and 1st Regional School of Machine Learning and Artificial Intelligence North 2</em>, Online, 2021, pp. 41-44, doi: <a href="https://doi.org/10.5753/erad-no2.2021.18679">https://doi.org/10.5753/erad-no2.2021.18679</a>.