William da Cruz, Jean-Max Dutertre, Jean-Baptiste Rigaud, and Guillaume Hubert. 2020.
Evidence of a dynamic fault model in the DICE radiation-hardened cell. In <em>Anais do XXXIII Symposium on Integrated Circuits and Systems Design</em>, agosto 24, 2020, Evento Online, Brasil. SBC, Porto Alegre, Brasil, 139-144.