V. Moia, R. Meneses, and I. Sanz.
" An Analysis of Real-World Vulnerabilities and Root Causes in the LLM Supply Chain", in <em>Anais Estendidos do XXV Simpósio Brasileiro de Cibersegurança</em>, Foz do Iguaçu/PR, 2025, pp. 388-396, doi: <a href="https://doi.org/10.5753/sbseg_estendido.2025.11811">https://doi.org/10.5753/sbseg_estendido.2025.11811</a>.