SANTIAGO, João P. O.; 						CABRAL, Lucas; 						SENA, Lucas; 						C.NETO, Joaquim Bento; 						LENON, Yuri; 						MACHADO, Javam.
 Deep Learning for Appearance Defect Inspection in Laptops: A Model Comparison. <em>In</em>: SEMINÁRIO INTEGRADO DE SOFTWARE E HARDWARE (SEMISH), 52.	, 2025, Maceió/AL.
	 
	<strong>Anais</strong> [...].
 Porto Alegre: Sociedade Brasileira de Computação, 
	2025
.
 p. 25-36. 
			ISSN 2595-6205. 
		DOI: <a href="https://doi.org/10.5753/semish.2025.7056">https://doi.org/10.5753/semish.2025.7056</a>.