João Santiago, Lucas Cabral, Lucas Sena, Joaquim C.Neto, Yuri Lenon, and Javam Machado. 2025.
 Deep Learning for Appearance Defect Inspection in Laptops: A Model Comparison. In <em>Anais do LII Seminário Integrado de Software e Hardware</em>, julho 20, 2025, Maceió/AL, Brasil. SBC, Porto Alegre, Brasil, 25-36. DOI: <a href="https://doi.org/10.5753/semish.2025.7056">https://doi.org/10.5753/semish.2025.7056</a>.