Santiago, J., 		Cabral, L., 		Sena, L., 		C.Neto, J., 		Lenon, Y., & 		Machado, J.
2025 jul 20.  Deep Learning for Appearance Defect Inspection in Laptops: A Model Comparison. Anais do Seminário Integrado de Software e Hardware (SEMISH). [Online] :