Santiago, João, 		Cabral, Lucas, 		Sena, Lucas, 		C.Neto, Joaquim, 		Lenon, Yuri, E 		Machado, Javam.
" Deep Learning for Appearance Defect Inspection in Laptops: A Model Comparison" <em>Anais do Seminário Integrado de Software e Hardware (SEMISH)</em> [Online], (20 julho 2025)