Threshold Mutation Operators for Test Data Selection Applied to Machine Learning Testing
Resumo
Machine learning (ML) models are commonly evaluated by sampling-based methods that estimate generalization performance but may fail to uncover fault-exposing inputs. Mutation-based test selection addresses that limitation by introducing controlled perturbations and selecting instances that distinguish the original model from mutated variants. Building on prior decision tree mutation testing (DTMT), this manuscript proposes two threshold-specific mutation operators for decision-tree-based test data selection, namely, local boundary threshold (LBT) and impurity-aware threshold (IAT). Both operators mutate a single internal-node threshold while preserving the original tree topology towards reducing mutant-generation cost and selecting challenging test inputs. Experimental results indicate that LBT and IAT generated fewer mutants than DTMT, selected more challenging test sets than standard sampling references, produced lower equivalent-mutant rates, and recovered around one-third of DTMT-selected instances. Such results suggest that LBT and IAT can serve as complementary, lower-cost test-selection strategies that expand the set of challenging instances identified by mutation-guided selection.
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