Strategies for Reducing Energy Consumption and Increasing Reliability in IoT
Abstract
The Internet of Things (IoT) demands new challenges for the design of computing and electronics components. One of the challenges is the power reduction of this large network of connected devices, where the majority is permanently connected. Another important issue, in a large set of applications, especially on critical areas as heath and transport, is reliability. This paper shows an overview of design strategies that we have developed to reduce power consumption and to increase reliability in circuits that are components of the IoT, as reduction of the number of transistors in IoT devices, using optimization techniques and physical design tolerant to radiation effects.
References
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GENNARO, R., ROSA, F., OLIVEIRA, A., KASTENSMIDT, F., OST, L., REIS, R. (2017), “Analyzing the Impact of Fault Tolerance Methods in ARM Processors under Soft Errors Running Linux and Parallelization APIs”, IEEE Transactions on Nuclear Science, Volume: 64, Issue: 8, August 2017, ISSN: 1558-1578, DOI: 10.1109/TNS.2017.2706519
LAZZARI, C., WIRTH, G., KASTENSMIDT, F., ANGHEL, L., REIS, R. (2011), “Asymmetric Transistor Sizing Targeting Radiation-Hardened Circuits”, Journal on Electrical Engineering, Springer, DOI: 10.1007/s00202-011-0212-8, June 2011.
KASTENSMIDT, F., CARRO, L.; REIS, R. (2006), “Fault-Tolerance Techniques for SRAM-Based FPGA”, Springer. April 2006, 183 p., ISBN 0-387-31068-1
NEUBERGER, G., WIRTH, G., REIS, R., (2014) “Protecting Chips Against Hold Time Violations Due to Variability”, Springer, 107 p., 2014. ISBN 978-94-007-2426-6. DOI: 10.1007/978-94-007-2427-3
NICOLAIDIS, M. (1999), “Time redundancy based soft-error tolerance to rescue nanometer technologies”. In: IEEE VLSI TEST SYMPOSIUM, 17., 1999. Proceedings... IEEE Computer Society, 1999. p. 86-94.
POSSER, G., FLACH, G., WILKE, G., REIS, R. (2011), “Gate Sizing Minimizing Delay and Area”, ISVLSI2011. IEEE Computer Society Annual Symposium on VLSI, Chennai, India, July 4-6, 2011. p. 315-316, ISBN 978-0-7695-4447-2. DOI: 10.1109/ISVLSI.2011.92
REIMANN, T., SZE, C., REIS, R. (2016), “Challenges of Cell Selection Algorithms in Industrial High Performance Microprocessor Designs”, Integration, Elsevier B. V., Volume 52, January 2016, Pages 347-354, ISSN: 0167-9260, DOI: 10.1016/j.vlsi.2015.09.001
REIS, R., (2010) “Redução de Consumo pela Otimização de Componentes”, SEMISH 2010, Anais do 37º Seminário Integrado de Software e Hardware, Belo Horizonte, 21 a 22 de julho de 2010, p. 371-379, ISSN: 2175-2761.
REIS, R. (2011A), “Design Automation of Transistor Networks, a New Challenge”. IEEE International Symposium on Circuits and Systems, ISCAS2011, Rio de Janeiro, Brasil, May 15-19, 2011. IEEE Press. p. 2485-2488, ISBN: 978-1-4244-9472-9. DOI: 10.1109/ISCAS.2011.5938108
REIS, R. (2011B), “Power Consumption & Reliability in NanoCMOS”, IEEE NANO, 11th International Conference on Nanotechnology, Portland, USA, August 15-19, 2011 (invited talk), p.711-714. ISBN 978-1-4577-1515-0, DOI: 10.1109/NANO.2011.6144656
The Connectivist (2014), [link]
The Economist (2010), 6 de setembro de 2010.
SIA (2015), Semiconductor Industry Association, Rebooting the IT Revolution, disponível em [link]
IHSMARKIT (2018), IoT Trend Watch 2018, disponível em: [link]
Techinsights (2017), [link]
VAZQUEZ, J., CHAMPAC, V., ZIESEMER, A., REIS, R., TEIXEIRA, I., SANTOS, M. e TEIXEIRA, P. (2012), “Delay Sensing for Long-Term Variations and Defects Monitoring in Safety–Critical Applications”, IN: Analog Integrated Circuits and Signal Processing, Volume 70, Number 2, 249-263, February 2012, Springer, ISSN 0925-1030, DOI: 10.1007/s10470-011-9789-0.
VELAZCO, R , FOUILLAT, P, REIS, R. (2007), “Radiation Effects on Embedded Systems”, Springer, June 2007. ISBN 978-1-4020-5645-1
Yakun Sophia Shao (2016), “Design and Modeling of Specialized Architectures, PhD Thesis, Harvard”, May 2016. Available at: [link]
ZIESEMER, A., REIS, R. (2015), “Physical Design Automation of Transistors Network”, Microelectronics Engineering, V. 148, p. 122-128, December 2015, Elsevier B.V., ISSN: 0167-9317, DOI: 10.1016/j.mee.2015.10.018
Published
2018-07-26
How to Cite
REIS, Ricardo.
Strategies for Reducing Energy Consumption and Increasing Reliability in IoT. In: INTEGRATED SOFTWARE AND HARDWARE SEMINAR (SEMISH), 45. , 2018, Natal.
Anais [...].
Porto Alegre: Sociedade Brasileira de Computação,
2018
.
p. 36-47.
ISSN 2595-6205.
DOI: https://doi.org/10.5753/semish.2018.3430.
